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Hertz Stress as a Connector
Design Parameter
By Dr. Robert S. Mroczkowski,
Director Technology, Consultant,
Bishop and Associates Inc.
I
was looking for some information
in my files a few weeks ago,
when I came across a folder
entitled “Hertz Stress.” My mind
leapt back 20 years as I
recalled discussions that the
concept had raised at that time.
Using Hertz stress as a
connector design parameter was
another attempt to find a
“Golden Rule” for connector
design, and it got quite a bit
of attention, including in some
standards organizations.
There are some common questions
about connector design
parameters that have lingered
over the years, including
requirements for minimum contact
normal force, plating thickness,
and porosity, among others. But
Hertz stress was a more
encompassing and quantitative
effort. I would like to revisit
the Hertz stress controversy
because it provides insights
into some of the complex
interactions among a number of
connector design parameters.
A little background on Hertz
stress is necessary. The
equations for Hertz stress
calculations were formulated by
Heinrich Hertz back in 1882,
and, while the formulae were
general, they were intended for
optical applications, in
particular the deformation of
lenses in contact. Because of
this fundamentally different
application, many of the
assumptions used to derive the
various Hertz stress formulae
are not appropriate for
connectors, an issue the
mathematically inclined may find
interesting. But, apart from
that limitation, Hertz stress
equations include three of the
most important connector design
parameters. For example, a Hertz
Stress equation for a
sphere-to-flat geometry,
representative of many connector
interface geometries, is:
sH
= [ FN (E/D) ]1/3
Equation
1
Where
sH
is the calculated Hertz
stress (Hertz stress cannot be
measured), FN
is the contact normal force,
E is the elastic modulus of
the materials in contact, and
D is the diameter of the
contact area created by the
applied normal force. Connector
contact springs are generally
made from copper alloys, which
fall in a limited range of
elastic moduli. So, for the
purposes of this discussion, the
analysis reduces to the
relationship between contact
force and contact interface
geometry.
We will return to Equation 1 again,
but the paper that stimulated
the discussion (Critical
Specifications for Dry Circuit
Connector Applications by
L.D. Hobgood and E.A. Kantner of
IBM Raleigh) does more than
present the Hertz stress
equation. It cites a survey of
connector applications that
correlates Hertz stress with the
field performance of connectors
in a variety of electronic
applications. I am a strong
proponent of taking field
experience as the best possible
guideline to connector
design/material validation. If a
connector design works in
application “A,” try it in
applications similar to A to
extend the application universe
for a given connector design.
From their survey, the authors
ultimately made a recommendation
of a minimum Hertz stress of
150,000 psi for twin-beam
contact systems to ensure
acceptable performance in the
field. (This stress cannot be
realized in connectors, another
reason why only the calculated
values are considered. The
actual stresses at the contact
interface cannot exceed the
yield stress of the material.)
Now the various parameters in
Equation 1 are obviously important
factors in achieving the
ultimate goal of connector
design, which is “to create and
maintain the integrity of a
metal-to-metal contact
interface” under the application
conditions of the connector. A
stable metal-to-metal contact
interface, in turn, will provide
a stable contact interface
electrical resistance, which is
the ultimate performance
requirement for a connector.
Equation 1 does address the creation
of the contact interface, that
is, to determine the contact
area. The relationship between
the contact force and the
contact area is straightforward
if the hardness of the materials
in contact is considered. The
units of hardness are Newtons/meter2,
so simply, a Newton of force
will create a contact area of X
square meters, a direct
relationship. So the contact
force determines the size of
contact area that will be
created at the contact
interface. But the shape of the
contact area depends on the
geometries of the surfaces
coming in contact. The Hertz
stress equation cited is for a
sphere-to-flat geometry,
therefore the contact area in
this case will be circular.
Consider now the relationship
between contact interface
resistance and the geometry of
the contact interface. For a
circular contact area, the
contact interface resistance, Rcontact,
will be given by:
Rcontact
=
r / D
Equation 2
Where
r is the resistivity
of the contact material and D is
the diameter of the contact
spot.
While the size of the contact
area is the dominant factor, the
contact area shape will have an
impact on the contact resistance
as well.
Returning to Equation 1, it is
apparent that a given value of
Hertz stress can be realized by
varying the contact force and/or
the contact geometry
independently. High forces and
large curvatures, and low forces
and small curvatures, can
produce the same Hertz stress.
This is the major limitation of
Hertz stress as a connector
design parameter, as will be
discussed in my next article
(come back October 4).
The purpose of the discussion up
to now is to confirm the obvious
— Hertz stress does not uniquely
determine the size and shape of
the contact interface, so it
does not uniquely determine the
electrical resistance.
Equation 1 provides no insight into
“maintaining the integrity” of
the contact interface. It is
important to note that the
integrity of the interface is
arguably a more important
performance requirement. The
electrical requirements of the
connector can be designed around
a range of connector
resistances, but resistance
instabilities are more difficult
to account for and accommodate.
The contact normal force is the
most important design parameter
in providing interface
stability. The friction forces
created at the interface by the
contact force provide the
mechanical stability of the
interface. Mechanical stability
is important because it is the
small-scale motions of the
contact interface — fretting
motions — that drive the
degradation of contact
interfaces, and therefore,
contact resistance.
Contact force also has a
significant impact on two
connector performance
requirements that are not
addressed by considerations of
Hertz stress; connector
durability (wear) and connector
mating force. Wear rates and
mating forces both increase with
increasing contact force.
Increases in contact force can
also result in discontinuous
increases in friction forces
that, in turn, can
discontinuously increase wear
rates and mating forces. It must
be noted that the contact mating
geometry also influences
connector wear and mating
forces. More about that topic in
my next article.
In summary, Hertz stress does
not definitively define the
contact interface size/shape,
and therefore, contact interface
resistance.
Because of this ambiguity, Hertz
stress offers no insight into
connector wear behavior or
mating forces, two very
important connector performance
parameters.
I’ll provide support for these
positions in the next article.
Stay tuned.
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Dr. Robert S. Mroczkowski
Director Technology, Bishop and Associates Inc.
In 1998, Dr. Mroczkowski founded
connNtext associates, a firm providing consulting services in
connector applications to the electronics industry. Dr.
Mroczkowski has more than 30 years experience in the electronics
industry. He joined AMP Inc. in 1971. While at AMP, his
responsibilities included consulting on connector design,
materials, and reliability concerns, and he provided an
interface to AMP customers on these issues. In 1990 he joined
the AMP Advanced Development Laboratories, where he developed
microstrip cable connectors and a new microcoaxial connector for
medical ultrasound diagnostic equipment. Dr. Mroczkowski retired
in 1998 as an AMP Principal. He is the author of the McGraw Hill
Electronics Connector Handbook, has contributed chapters on
connectors and interconnections to a number of packaging
handbooks, and written more than 20 technical papers. He holds
seven patents. In 1997, Dr. Mroczkowski received the Lifetime
Achievement Award of the International Institute of Connector
and Interconnection Technology. He holds a bachelor’s, master’s,
and doctorate of science degrees in physical metallurgy from the
Massachusetts Institute of Technology. Contact Dr. Mroczkowski
at
ConnNtextassoc@aol.com. |
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